2010 Technical Conference - Special Events

Four valuable opportunities for attendees of the 2010 IPA + IDEAlliance Technical Conference!

Ink Optimization Software Study Results Book
Comprehensive results book provided at no cost to each attendee

IPA+IDEAlliance has recently completed an exhaustive evaluation of ink-saving technologies, with results to provide an invaluable resource for prospective buyers of ink optimization solutions. In the Ink Optimization RoundUP, participating manufacturers put their software through a series of tests designed to assess their ink saving and quality capabilities. The comprehensive results book, complete with printed samples submitted from each solution, will be provided at no cost to each attendee of the IPA+IDEAlliance Technical Conference.

Gallery of Value Added Print
New print technology samples on display

The inaugural Gallery of Value Added Print will premier at the IDEAlliance + IPA Technical Conference, June 7-8, 2010, showcasing the latest innovations in printing technology. The Gallery of Value Added Print will feature print samples manufactured with technologies including metallics, textured coating, expanded gamut printing, and many other technologies that are adding value for the print buyer and profits for the printer.

Gallery of Proofs
See how YOUR proofs compare to your peers

Attendees are invited to download a PDF test form, proof it to their standard GRACoL or SWOP settings, and bring the proof(s) to the conference to be measured and displayed. Where past Proofing Galleries have featured proofs carefully made by manufacturers, this gallery is for you, the printer, trade shop, or agency to see how your proofs compare – visually, and numerically, to your peers.

DOWNLOAD TEST FORM

Instrument Round-Robin
Discover if your instruments are in-tune

Attendees are invited to bring their handheld spectrophometers to the conference to determine its level of calibration. Your measurement instrument will be used to measure a Standard Reference Material (SRM) target with traceable values. With this measurement data in-hand, you’ll better understand how your instruments compare to your peers.